Damage effect and mechanism of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
席晓文, 柴常春, 赵刚, 杨银堂, 于新海, 刘阳
Damage effect and mechanism of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
Xiao-Wen Xi(席晓文), Chang-Chun Chai(柴常春), Gang Zhao(赵刚), Yin-Tang Yang(杨银堂), Xin-Hai Yu(于新海), Yang Liu(刘阳)
中国物理B
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2016, (4): 48503
-048503
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DOI: 10.1088/1674-1056/25/4/048503