Carrier behavior of HgTe under high pressure revealed by Hall effect measurement
胡廷静, 崔晓岩, 李雪飞, 王婧姝, 吕秀梅, 王棱升, 杨景海, 高春晓
Carrier behavior of HgTe under high pressure revealed by Hall effect measurement
Hu Ting-Jing (胡廷静), Cui Xiao-Yan (崔晓岩), Li Xue-Fei (李雪飞), Wang Jing-Shu (王婧姝), Lü Xiu-Mei (吕秀梅), Wang Ling-Sheng (王棱升), Yang Jing-Hai (杨景海), Gao Chun-Xiao (高春晓)
中国物理B
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2015, (11): 116401
-116401
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DOI: 10.1088/1674-1056/24/11/116401