Nondestructive measurement of thermal contact resistance for the power vertical double-diffused metal-oxide-semiconductor
李睿, 郭春生, 冯士维, 石磊, 朱慧, 王琳
Nondestructive measurement of thermal contact resistance for the power vertical double-diffused metal-oxide-semiconductor
Li Rui (李睿), Guo Chun-Sheng (郭春生), Feng Shi-Wei (冯士维), Shi Lei (石磊), Zhu Hui (朱慧), Wang Lin (王琳)
中国物理B
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2015, (7): 76601
-076601
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DOI: 10.1088/1674-1056/24/7/076601