Characterizing silicon intercalated graphene grown epitaxially on Ir films by atomic force microscopy

张勇, 王业亮, 阙炎德, 高鸿钧

Zhang Yong (张勇), Wang Ye-Liang (王业亮), Que Yan-De (阙炎德), Gao Hong-Jun (高鸿钧)

中国物理B . 2015, (7): 78104 -078104 . DOI: 10.1088/1674-1056/24/7/078104