Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiN
x matrix by the influence of near-interface oxide traps
方忠慧, 江小帆, 陈坤基, 王越飞, 李伟, 徐骏
Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiN
x matrix by the influence of near-interface oxide traps
Fang Zhong-Hui (方忠慧), Jiang Xiao-Fan (江小帆), Chen Kun-Ji (陈坤基), Wang Yue-Fei (王越飞), Li Wei (李伟), Xu Jun (徐骏)
中国物理B
.
2015, (1): 17305
-017305
.
DOI: 10.1088/1674-1056/24/1/017305