Investigation of strain effect on the hole mobility in GOI tri-gate pFETs including quantum confinement

秦洁宇, 杜刚, 刘晓彦

Qin Jie-Yu (秦洁宇), Du Gang (杜刚), Liu Xiao-Yan (刘晓彦)

中国物理B . 2014, (10): 108501 -108501 . DOI: 10.1088/1674-1056/23/10/108501