Structural properties of a-SiO x：H films studied by an improved infrared-transmission analysis method
王烁, 张晓丹, 熊绍珍, 赵颖
Structural properties of a-SiO x：H films studied by an improved infrared-transmission analysis method
Wang Shuo (王烁), Zhang Xiao-Dan (张晓丹), Xiong Shao-Zhen (熊绍珍), Zhao Ying (赵颖)
Chin. Phys. B . 2014, (9): 98801 -098801 .  DOI: 10.1088/1674-1056/23/9/098801