Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance
宫俊波, 董伟乐, 代如成, 王中平, 张增明, 丁泽军
Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance
Gong Jun-Bo (宫俊波), Dong Wei-Le (董伟乐), Dai Ru-Cheng (代如成), Wang Zhong-Ping (王中平), Zhang Zeng-Ming (张增明), Ding Ze-Jun (丁泽军)
中国物理B
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2014, (8): 87802
-087802
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DOI: 10.1088/1674-1056/23/8/087802