Effects of annealing temperature on the electrical property and microstructure of aluminum contact on n-type 3C-SiC
代冲冲, 刘学超, 周天宇, 卓世异, 石彪, 施尔畏
Effects of annealing temperature on the electrical property and microstructure of aluminum contact on n-type 3C-SiC
Dai Chong-Chong (代冲冲), Liu Xue-Chao (刘学超), Zhou Tian-Yu (周天宇), Zhuo Shi-Yi (卓世异), Shi Biao (石彪), Shi Er-Wei (施尔畏)
中国物理B
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2014, (6): 66803
-066803
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DOI: 10.1088/1674-1056/23/6/066803