Effects of annealing process on characteristics of fully transparent zinc tin oxide thin-film transistor
陈勇跃, 王雄, 才玺坤, 原子健, 朱夏明, 邱东江, 吴惠桢
Effects of annealing process on characteristics of fully transparent zinc tin oxide thin-film transistor
Chen Yong-Yue (陈勇跃), Wang Xiong (王雄), Cai Xi-Kun (才玺坤), Yuan Zi-Jian (原子健), Zhu Xia-Ming (朱夏明), Qiu Dong-Jiang (邱东江), Wu Hui-Zhen (吴惠桢)
中国物理B
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2014, (2): 26101
-026101
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DOI: 10.1088/1674-1056/23/2/026101