Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy
方美华, 魏志勇, 张紫霞, 朱立, 府宇, 石苗, 黎光武, 郭刚
Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy
Fang Mei-Hua (方美华), Wei Zhi-Yong (魏志勇), Zhang Zi-Xia (张紫霞), Zhu Li (朱立), Fu Yu (府宇), Shi Miao (石苗), Li Guang-Wu (黎光武), Guo Gang (郭刚)
中国物理B
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2013, (11): 116105
-116105
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DOI: 10.1088/1674-1056/22/11/116105