Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p–Si and Al/Bi <sub>4</sub>Ti <sub>3</sub>O <sub>12</sub>/p–Si structures by using the admittance spectroscopy method

Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p–Si and Al/Bi ₄Ti ₃O ₁₂/p–Si structures by using the admittance spectroscopy method

Mert Yíldírím, Perihan Durmuş, Şemsettin Altíndal

Analyses of temperature-dependent interface states, series resistances, and AC electrical conductivities of Al/p–Si and Al/Bi ₄Ti ₃O ₁₂/p–Si structures by using the admittance spectroscopy method

Mert Yíldírím, Perihan Durmuş, Şemsettin Altíndal

中国物理B . 2013, (10): 108502 -108502 . DOI: 10.1088/1674-1056/22/10/108502