×
模态框（Modal）标题
在这里添加一些文本
关闭
关闭
提交更改
取消
确定并提交
×
模态框（Modal）标题
在这里添加一些文本
关闭
Accurate measurement and influence on device reliability of defect density of a light-emitting diode
郭祖强, 钱可元
Accurate measurement and influence on device reliability of defect density of a light-emitting diode
Guo Zu-Qiang (郭祖强), Qian Ke-Yuan (钱可元)
中国物理B . 2013, (
10
): 106108 -106108 . DOI: 10.1088/1674-1056/22/10/106108