Hardening measures for bipolar transistor against microwave-induced damage
柴常春, 马振洋, 任兴荣, 杨银堂, 赵颖博, 于新海
Hardening measures for bipolar transistor against microwave-induced damage
Chai Chang-Chun (柴常春), Ma Zhen-Yang (马振洋), Ren Xing-Rong (任兴荣), Yang Yin-Tang (杨银堂), Zhao Ying-Bo (赵颖博), Yu Xin Hai (于新海)
中国物理B
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2013, (6): 68502
-068502
.
DOI: 10.1088/1674-1056/22/6/068502