Modeling of tunneling current in ultrathin MOS structure with interface trap charge and fixed oxide charge

胡波, 黄仕华, 吴锋民

Hu Bo (胡波), Huang Shi-Hua (黄仕华), Wu Feng-Min (吴锋民)

Chin. Phys. B . 2013, (1): 17301 -017301 . DOI: 10.1088/1674-1056/22/1/017301