Incident particle range dependence of radiation damage in a power bipolar junction transistor
刘超铭, 李兴冀, 耿洪滨, 芮二明, 郭立新, 杨剑群
Incident particle range dependence of radiation damage in a power bipolar junction transistor
Liu Chao-Ming (刘超铭), Li Xing-Ji (李兴冀), Geng Hong-Bin (耿洪滨), Rui Er-Ming (芮二明), Guo Li-Xin (郭立新), Yang Jian-Qun (杨剑群)
中国物理B
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2012, (10): 104211
-104211
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DOI: 10.1088/1674-1056/21/10/104211