Microwave damage susceptibility trend of bipolar transistor as a function of frequency
马振洋, 柴常春, 任兴荣, 杨银堂, 陈斌, 宋坤, 赵颖博
Microwave damage susceptibility trend of bipolar transistor as a function of frequency
Ma Zhen-Yang (马振洋), Chai Chang-Chun (柴常春), Ren Xing-Rong (任兴荣), Yang Yin-Tang (杨银堂), Chen Bin (陈斌), Song Kun (宋坤), Zhao Ying-Bo (赵颖博)
中国物理B
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2012, (9): 98502
-098502
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DOI: 10.1088/1674-1056/21/9/098502