Degradation of the transconductance of gate-modulated generation current in nMOSFET

陈海峰, 过立新, 杜慧敏

Chen Hai-Feng (陈海峰), Guo Li-Xin (过立新), Du Hui-Min (杜慧敏 )

中国物理B . 2012, (8): 88501 -088501 . DOI: 10.1088/1674-1056/21/8/088501