Numerical study on the dependence of ZnO thin-film transistor characteristics on grain boundary position

张安, 赵小如, 段利兵, 刘金铭, 赵建林

Zhang An(张安), Zhao Xiao-Ru(赵小如), Duan Li-Bing(段利兵), Liu Jin-Ming(刘金铭), and Zhao Jian-Lin(赵建林)

中国物理B . 2011, (5): 57201 -057201 . DOI: 10.1088/1674-1056/20/5/057201