Measurements of electron–phonon coupling factor and interfacial thermal resistance of metallic nano-films using a transient thermoreflectance technique
王海东, 马维刚, 过增元, 张兴, 王玮
Measurements of electron–phonon coupling factor and interfacial thermal resistance of metallic nano-films using a transient thermoreflectance technique
Wang Hai-Dong(王海东), Ma Wei-Gang(马维刚), Guo Zeng-Yuan(过增元), Zhang Xing(张兴), and Wang Wei(王玮)
中国物理B . 2011, (4): 40701 -040701 .  DOI: 10.1088/1674-1056/20/4/040701