Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction
郭希, 王玉田, 赵德刚, 江德生, 朱建军, 刘宗顺, 王辉, 张书明, 邱永鑫, 徐科, 杨辉
Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction
Guo Xi (郭希), Wang Yu-Tian (王玉田), Zhao De-Gang (赵德刚), Jiang De-Sheng (江德生), Zhu Jian-Jun (朱建军), Liu Zong-Shun (刘宗顺), Wang Hui (王辉), Zhang Shu-Ming (张书明), Qiu Yong-Xin (邱永鑫), Xu Ke (徐科), Yang Hui (杨辉)
中国物理B
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2010, (7): 76804
-076804
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DOI: 10.1088/1674-1056/19/7/076804