Two-dimensional analysis of the interface states effects on current gain for 4H

张有润, 张波, 李肇基, 邓小川

Two-dimensional analysis of the interface states effects on current gain for 4H－SiC bipolar junction transistor

Zhang You-Run(张有润), Zhang Bo(张波), Li Zhao-Ji(李肇基), and Deng Xiao-Chuan(邓小川)

中国物理B . 2010, (6): 67102 -067102 . DOI: 10.1088/1674-1056/19/6/067102