Degradation mechanisms of current gain in NPN transistors
李兴冀, 耿洪滨, 兰慕杰, 杨德庄, 何世禹, 刘超铭
Degradation mechanisms of current gain in NPN transistors
Li Xing-Ji(李兴冀), Geng Hong-Bin(耿洪滨), Lan Mu-Jie(兰慕杰), Yang De-Zhuang(杨德庄), He Shi-Yu(何世禹), and Liu Chao-Ming(刘超铭)
中国物理B
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2010, (6): 66103
-066103
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DOI: 10.1088/1674-1056/19/6/066103