Effect of interface roughness on the carrier transport in germanium MOSFETs investigated by Monte Carlo method

杜刚, 刘晓彦, 夏志良, 杨竞峰, 韩汝琦

Du Gang(杜刚), Liu Xiao-Yan(刘晓彦), Xia Zhi-Liang(夏志良), Yang Jing-Feng(杨竞峰), and Han Ru-Qi(韩汝琦)

中国物理B . 2010, (5): 57304 -057304 . DOI: 10.1088/1674-1056/19/5/057304