Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques
郭希, 王辉, 江德生, 王玉田, 赵德刚, 朱建军, 刘宗顺, 张书明, 杨辉
Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques
Guo Xi(郭希), Wang Hui(王辉), Jiang De-Sheng(江德生), Wang Yu-Tian(王玉田), Zhao De-Gang(赵德刚), Zhu Jian-Jun(朱建军), Liu Zong-Shun(刘宗顺), Zhang Shu-Ming(张书明), and Yang Hui(杨辉)
中国物理B
.
2010, (10): 106802
-106802
.
DOI: 10.1088/1674-1056/19/10/106802