Degradation mechanism of two-dimensional electron gas density in high Al-content AlGaN/GaN heterostructures

张进成, 郑鹏天, 张娟, 许志豪, 郝跃

Zhang Jin-Cheng(张进成), Zheng Peng-Tian(郑鹏天), Zhang Juan(张娟), Xu Zhi-Hao(许志豪), and Hao Yue(郝跃)

中国物理B . 2009, (7): 2998 -3001 . DOI: 10.1088/1674-1056/18/7/063