Characterization of ZnO nanowire field-effect transistors and exposed to ultraviolet radiation
黎明, 张海英, 郭常新, 徐静波, 付晓君, 陈普锋
Characterization of ZnO nanowire field-effect transistors and exposed to ultraviolet radiation
Li Ming(黎明), Zhang Hai-Ying(张海英), Guo Chang-Xin(郭常新), Xu Jing-Bo(徐静波), Fu Xiao-Jun(付晓君), and Chen Pu-Feng(陈普锋)
中国物理B
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2009, (11): 5020
-5023
.
DOI: 10.1088/1674-1056/18/11/067