Raman analysis of defects in n-type 4H-SiC
杨银堂, 韩茹, 王平
Raman analysis of defects in n-type 4H-SiC
Yang Yin-Tang(杨银堂), Han Ru(韩茹), and Wang-Ping(王平)
中国物理B . 2008, (9): 3459 -3463 .  DOI: 10.1088/1674-1056/17/9/053