Reliability analysis of GaN-based light emitting diodes for solid state illumination

杨凌, 马晓华, 冯倩, 郝跃

Yang Ling(杨凌), Ma Xiao-Hua(马晓华), Feng Qian(冯倩), and Hao Yue(郝跃)

中国物理B . 2008, (7): 2696 -2700 . DOI: 10.1088/1674-1056/17/7/056