Trap states in oxidation layer of nanocrystal Si
黄伟其, 王海旭, 金 峰, 秦朝建
Trap states in oxidation layer of nanocrystal Si
Huang Wei-Qi(黄伟其), Wang Hai-Xu(王海旭), Jin Feng(金峰), and Qin Cao-Jian(秦朝建)
中国物理B
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2008, (10): 3753
-3758
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DOI: 10.1088/1674-1056/17/10/037