Formation mechanism of Ge nanocrystals embedded in SiO 2 studied by fluorescence x-ray absorption fine structure
闫文盛, 李忠瑞, 孙治湖, 潘志云, 韦世强
Formation mechanism of Ge nanocrystals embedded in SiO 2 studied by fluorescence x-ray absorption fine structure
Yan Wen-Sheng(闫文盛), Li Zhong-Rui(李忠瑞), Sun Zhi-Hu(孙治湖), Pan Zhi-Yun(潘志云), and Wei Shi-Qiang(韦世强)
中国物理B . 2007, (9): 2764 -2768 .  DOI: 10.1088/1009-1963/16/9/044