Electronic structure and defect states of transition films from amorphous to microcrystalline silicon studied by surface photovoltage spectroscopy
于威, 王春生, 路万兵, 何杰, 韩晓霞, 傅广生
Electronic structure and defect states of transition films from amorphous to microcrystalline silicon studied by surface photovoltage spectroscopy
Yu Wei(于威), Wang Chun-Sheng(王春生), Lu Wan-Bing(路万兵), He Jie(何杰), Han Xiao-Xia(韩晓霞), and Fu Guang-Sheng(傅广生)
中国物理B
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2007, (8): 2310
-2314
.
DOI: 10.1088/1009-1963/16/8/025