New aspects of HCI test for ultra-short channel n-MOSFET devices

马晓华, 郝跃, 王剑屏, 曹艳荣, 陈海峰

Ma Xiao-Hua(马晓华), Hao Yue(郝跃), Wang Jian-Ping(王剑屏), Cao Yan-Rong(曹艳荣), and Chen Hai-Feng(陈海峰)

中国物理B . 2006, (11): 2742 -2745 . DOI: 10.1088/1009-1963/15/11/047