Low-parasitic ESD protection strategy for RF ICs in 0.35μm CMOS process
王 源, 贾 嵩, 陈中建, 吉利久
Low-parasitic ESD protection strategy for RF ICs in 0.35μm CMOS process
Wang Yuan(王源), Jia Song(贾嵩), Chen Zhong-Jian(陈中建), and Ji Li-Jiu(吉利久)
中国物理B . 2006, (10): 2297 -2305 .  DOI: 10.1088/1009-1963/15/10/018