ACCURATE DETERMINATION OF FILM THICKNESS BY LOW-ANGLE X-RAY REFLECTION
徐明, 杨涛, 于文学, 杨宁, 刘翠秀, 麦振洪, 赖武彦, 陶琨
ACCURATE DETERMINATION OF FILM THICKNESS BY LOW-ANGLE X-RAY REFLECTION
Xu Ming (徐明), Yang Tao (杨涛), Yu Wen-xue (于文学), Yang Ning (杨宁), Liu Cui-xiu (刘翠秀), Mai Zhen-hong (麦振洪), Lai Wu-yan (赖武彦), Tao Kun (陶琨)
中国物理B
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2000, (11): 833
-836
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DOI: 10.1088/1009-1963/9/11/007