STRESS ANALYSIS IN CUBIC BORON NITRIDE FILMS BY X-RAY DIFFRACTION USING sin 2 ψ METHOD
张兴旺, 岳金顺, 陈光华, 严辉, 刘文君
STRESS ANALYSIS IN CUBIC BORON NITRIDE FILMS BY X-RAY DIFFRACTION USING sin 2$\psi$  METHOD
ZHANG XING-WANG (张兴旺), YUE JIN-SHUN (岳金顺), CHEN GUANG-HUA (陈光华), YAN HUI (严辉), LIU WEN-JUN (刘文君)
中国物理B . 1998, (1): 61 -67 .  DOI: 10.1088/1004-423X/7/1/007