中国物理B ›› 2024, Vol. 33 ›› Issue (4): 45205-045205.doi: 10.1088/1674-1056/ad1821

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Plasma potential measurements using an emissive probe made of oxide cathode

Jian-Quan Li(李建泉)1,2, Hai-Jie Ma(马海杰)1,2, and Wen-Qi Lu(陆文琪)3,†   

  1. 1 Department of Electronic and Communication Engineering, North China Electric Power University, Baoding 071003, China;
    2 Hebei Key Laboratory of Power Internet of Things Technology, North China Electric Power University, Baoding 071003, China;
    3 Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, School of Physics, Dalian University of Technology, Dalian 116024, China
  • 收稿日期:2023-10-27 修回日期:2023-12-11 接受日期:2023-12-22 出版日期:2024-03-19 发布日期:2024-04-01
  • 通讯作者: Wen-Qi Lu E-mail:luwenqi@dlut.edu.cn
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 11905076) and S&T Program of Hebei (Grant No. SZX2020034).

Plasma potential measurements using an emissive probe made of oxide cathode

Jian-Quan Li(李建泉)1,2, Hai-Jie Ma(马海杰)1,2, and Wen-Qi Lu(陆文琪)3,†   

  1. 1 Department of Electronic and Communication Engineering, North China Electric Power University, Baoding 071003, China;
    2 Hebei Key Laboratory of Power Internet of Things Technology, North China Electric Power University, Baoding 071003, China;
    3 Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, School of Physics, Dalian University of Technology, Dalian 116024, China
  • Received:2023-10-27 Revised:2023-12-11 Accepted:2023-12-22 Online:2024-03-19 Published:2024-04-01
  • Contact: Wen-Qi Lu E-mail:luwenqi@dlut.edu.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 11905076) and S&T Program of Hebei (Grant No. SZX2020034).

摘要: A novel emissive probe consisting of an oxide cathode coating is developed to achieve a low operating temperature and long service life. The properties of the novel emissive probe are investigated in detail, in comparison with a traditional tungsten emissive probe, including the operating temperature, the electron emission capability and the plasma potential measurement. Studies of the operating temperature and electron emission capability show that the tungsten emissive probe usually works at a temperature of 1800 K—2200 K while the oxide cathode emissive probe can function at about 1200 K—1400 K. In addition, plasma potential measurements using the oxide cathode emissive probe with different techniques have been accomplished in microwave electron cyclotron resonance plasmas with different discharge powers. It is found that a reliable plasma potential can be obtained using the improved inflection point method and the hot probe with zero emission limit method, while the floating point method is invalid for the oxide cathode emissive probe.

关键词: emissive probe, oxide cathode, plasma potential, filament temperature

Abstract: A novel emissive probe consisting of an oxide cathode coating is developed to achieve a low operating temperature and long service life. The properties of the novel emissive probe are investigated in detail, in comparison with a traditional tungsten emissive probe, including the operating temperature, the electron emission capability and the plasma potential measurement. Studies of the operating temperature and electron emission capability show that the tungsten emissive probe usually works at a temperature of 1800 K—2200 K while the oxide cathode emissive probe can function at about 1200 K—1400 K. In addition, plasma potential measurements using the oxide cathode emissive probe with different techniques have been accomplished in microwave electron cyclotron resonance plasmas with different discharge powers. It is found that a reliable plasma potential can be obtained using the improved inflection point method and the hot probe with zero emission limit method, while the floating point method is invalid for the oxide cathode emissive probe.

Key words: emissive probe, oxide cathode, plasma potential, filament temperature

中图分类号:  (Plasma diagnostic techniques and instrumentation)

  • 52.70.-m
52.70.Ds (Electric and magnetic measurements) 79.40.+z (Thermionic emission)