中国物理B ›› 2022, Vol. 31 ›› Issue (9): 98702-098702.doi: 10.1088/1674-1056/ac600e

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X-ray phase-sensitive microscope imaging with a grating interferometer: Theory and simulation

Jiecheng Yang(杨杰成)1, Peiping Zhu(朱佩平)2,3,†, Dong Liang(梁栋)1,4, Hairong Zheng(郑海荣)4, and Yongshuai Ge(葛永帅)1,4,‡   

  1. 1 Research Center for Medical Artificial Intelligence, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China;
    2 Platform of Advanced Photon Source Technology R&D, Laboratory of X-ray Optics and Technology, Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, 100049, China;
    3 Beijing Advanced Innovation Center for Imaging Theory and Technology, Capital Normal University, Beijing 100048, China;
    4 Paul C Lauterbur Research Center for Biomedical Imaging, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China
  • 收稿日期:2021-12-29 修回日期:2022-03-10 接受日期:2022-03-23 出版日期:2022-08-19 发布日期:2022-09-03
  • 通讯作者: Peiping Zhu, Yongshuai Ge E-mail:zhupp@ihep.ac.cn;ys.ge@siat.ac.cn
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 12027812 and 11804356) and the Youth Innovation Promotion Association of the Chinese Academy of Sciences (Grant No. 2021362).

X-ray phase-sensitive microscope imaging with a grating interferometer: Theory and simulation

Jiecheng Yang(杨杰成)1, Peiping Zhu(朱佩平)2,3,†, Dong Liang(梁栋)1,4, Hairong Zheng(郑海荣)4, and Yongshuai Ge(葛永帅)1,4,‡   

  1. 1 Research Center for Medical Artificial Intelligence, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China;
    2 Platform of Advanced Photon Source Technology R&D, Laboratory of X-ray Optics and Technology, Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, 100049, China;
    3 Beijing Advanced Innovation Center for Imaging Theory and Technology, Capital Normal University, Beijing 100048, China;
    4 Paul C Lauterbur Research Center for Biomedical Imaging, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China
  • Received:2021-12-29 Revised:2022-03-10 Accepted:2022-03-23 Online:2022-08-19 Published:2022-09-03
  • Contact: Peiping Zhu, Yongshuai Ge E-mail:zhupp@ihep.ac.cn;ys.ge@siat.ac.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 12027812 and 11804356) and the Youth Innovation Promotion Association of the Chinese Academy of Sciences (Grant No. 2021362).

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摘要： A general theoretical framework is presented to explain the formation of the phase signal in an x-ray microscope integrated with a grating interferometer, which simultaneously enables the high spatial resolution imaging and the improved image contrast. By using this theory, several key parameters of phase contrast imaging can be predicted, for instance, the fringe visibility and period, and the conversion condition from the differential phase imaging (DPI) to the phase difference imaging (PDI). Additionally, numerical simulations are performed with certain x-ray optical components and imaging geometry. Comparison with the available experimental measurement [Appl. Phys. Lett. 113 063105 (2018)] demonstrates the accuracy of this developed quantitative analysis method of x-ray phase-sensitive microscope imaging.

关键词: x-ray phase contrast imaging, x-ray microscope, grating interferometer

Abstract: A general theoretical framework is presented to explain the formation of the phase signal in an x-ray microscope integrated with a grating interferometer, which simultaneously enables the high spatial resolution imaging and the improved image contrast. By using this theory, several key parameters of phase contrast imaging can be predicted, for instance, the fringe visibility and period, and the conversion condition from the differential phase imaging (DPI) to the phase difference imaging (PDI). Additionally, numerical simulations are performed with certain x-ray optical components and imaging geometry. Comparison with the available experimental measurement [Appl. Phys. Lett. 113 063105 (2018)] demonstrates the accuracy of this developed quantitative analysis method of x-ray phase-sensitive microscope imaging.

Key words: x-ray phase contrast imaging, x-ray microscope, grating interferometer

中图分类号:  (X-ray imaging)

  • 87.59.-e
07.85.Tt (X-ray microscopes) 07.60.Ly (Interferometers) 42.30.Rx (Phase retrieval)