中国物理B ›› 2010, Vol. 19 ›› Issue (6): 67201-067201.doi: 10.1088/1674-1056/19/6/067201

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Influence of line defects on focusing in a two-dimensional photonic-crystal flat lens

冯志芳   

  1. Beijing University of Chemical Technology, Beijing 100029, China
  • 收稿日期:2009-05-04 出版日期:2010-06-15 发布日期:2010-06-15
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No.~10704006).

Influence of line defects on focusing in a two-dimensional photonic-crystal flat lens

Feng Zhi-Fang(冯志芳)   

  1. Beijing University of Chemical Technology, Beijing 100029, China
  • Received:2009-05-04 Online:2010-06-15 Published:2010-06-15
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No.~10704006).

摘要: We investigate in detail the influence of line defects on focusing of electromagnetic waves in a two-dimensional photonic-crystal flat lens. Through simulations, we find that a focusing can always be observed when a line defect in the lens is introduced along the light transmission direction and the width of the line defect is less than \lambda /2. However, there appear two focusings when the width of the line defect is more than \lambda /2. When the line defect is introduced along the direction perpendicular to the transmission, there is always one focusing.

Abstract: We investigate in detail the influence of line defects on focusing of electromagnetic waves in a two-dimensional photonic-crystal flat lens. Through simulations, we find that a focusing can always be observed when a line defect in the lens is introduced along the light transmission direction and the width of the line defect is less than $\lambda$/2. However, there appear two focusings when the width of the line defect is more than $\lambda$/2. When the line defect is introduced along the direction perpendicular to the transmission, there is always one focusing.

Key words: flat lens, line defect, photonic crysta

中图分类号:  (Lenses, prisms and mirrors)

  • 42.79.Bh
42.70.Qs (Photonic bandgap materials) 02.70.Bf (Finite-difference methods)