中国物理B ›› 2009, Vol. 18 ›› Issue (10): 4547-4551.doi: 10.1088/1674-1056/18/10/075
顾广瑞1, 伊藤利道2
Gu Guang-Rui(顾广瑞)a)† and Ito Toshimichi(伊藤利道)b)
摘要: This paper reports that the nano-sheet carbon films (NSCFs) were fabricated on Si wafer chips with hydrogen--methane gas mixture by means of quartz-tube-type microwave plasma chemical vapour deposition (MWPCVD). In order to further improve the field emission (FE) characteristics, a 5-nm Au film was prepared on the samples by using electron beam evaporation. The FE properties were obviously improved due to depositing Au thin film on NSCFs. The FE current density at a macroscopic electric field, E, of 9~V/μ m was increased from 12.4~mA/cm2 to 27.2~mA/cm2 and the threshold field was decreased from 2.6~V/μ m to 2.0~V/μ m for Au-coated carbon films. A modified F-N model considering statistic effects of FE tip structures in the low E region and a space-charge-limited-current effect in the high E region were applied successfully to explain the FE data of the Au-coated NSCF.
中图分类号: (Field emission, ionization, evaporation, and desorption)