中国物理B ›› 2008, Vol. 17 ›› Issue (8): 2956-2962.doi: 10.1088/1674-1056/17/8/032

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Fractal characteristics investigation on electromagnetic scattering from 2-D Weierstrass fractal dielectric rough surface

郭立新1, 任新成2   

  1. (1)School of Science, Xi'dian University, Xi'an 710071, China; (2)School of Science, Xi'dian University, Xi'an 710071, China;College of Physics and Electronic Information, Yan'an University, Yan'an 716000, China
  • 收稿日期:2007-07-26 修回日期:2008-03-25 出版日期:2008-08-20 发布日期:2008-08-20
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No 60571058), Specialized Research Fund for the Doctoral Program of Higher Education, China (Grant No 20070701010).

Fractal characteristics investigation on electromagnetic scattering from 2-D Weierstrass fractal dielectric rough surface

Ren Xin-Cheng(任新成)a)b)† and Guo Li-Xin(郭立新)a)   

  1. a School of Science, Xi'dian University, Xi'an 710071, China; b College of Physics and Electronic Information, Yan'an University, Yan'an 716000, China
  • Received:2007-07-26 Revised:2008-03-25 Online:2008-08-20 Published:2008-08-20
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No 60571058), Specialized Research Fund for the Doctoral Program of Higher Education, China (Grant No 20070701010).

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摘要： A normalized two-dimensional band-limited Weierstrass fractal function is used for modelling the dielectric rough surface. An analytic solution of the scattered field is derived based on the Kirchhoff approximation. The variance of scattering intensity is presented to study the fractal characteristics through theoretical analysis and numerical calculations. The important conclusion is obtained that the diffracted envelope slopes of scattering pattern can be approximated as a slope of linear equation. This conclusion will be applicable for solving the inverse problem of reconstructing rough surface and remote sensing.

关键词: dielectric rough surface, 2-$D$ band-limited Weierstrass fractal function, fractal characteristics, Kirchhoff approximation

Abstract: A normalized two-dimensional band-limited Weierstrass fractal function is used for modelling the dielectric rough surface. An analytic solution of the scattered field is derived based on the Kirchhoff approximation. The variance of scattering intensity is presented to study the fractal characteristics through theoretical analysis and numerical calculations. The important conclusion is obtained that the diffracted envelope slopes of scattering pattern can be approximated as a slope of linear equation. This conclusion will be applicable for solving the inverse problem of reconstructing rough surface and remote sensing.

Key words: dielectric rough surface, 2-$D$ band-limited Weierstrass fractal function, fractal characteristics, Kirchhoff approximation

中图分类号:  (Electromagnetic wave propagation; radiowave propagation)

  • 41.20.Jb
02.60.-x (Numerical approximation and analysis)