中国物理B ›› 2001, Vol. 10 ›› Issue (13): 65-69.

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LARGE AND EXTREMELY FAST THIRD-ORDER NON-LINEARITY OF Ag NANOPARTICLES EMBEDDED INTO A CsxO SEMICONDUCTOR MATRIX

张琦锋1, 邵庆益1, 侯士敏1, 张耿民1, 刘惟敏1, 薛增泉1, 吴锦雷1, 王树峰2, 梁瑞生2, 黄文涛2, 王丹翎2, 龚旗煌2   

  1. (1)Department of Electronics, Peking University, Beijing 100871, China; (2)Department of Physics, Peking University, Beijing 100871, China
  • 收稿日期:2001-03-14 出版日期:2001-12-25 发布日期:2005-07-07
  • 基金资助:
    Project supported partly by the National Natural Science Foundation of China (Grant No. 60071017) and the Natural Science Foundation of Beijing, China (Grant No. 2992019).

LARGE AND EXTREMELY FAST THIRD-ORDER NON-LINEARITY OF Ag NANOPARTICLES EMBEDDED INTO A CsxO SEMICONDUCTOR MATRIX

Zhang Qi-feng (张琦锋)a, Shao Qing-yi (邵庆益)a, Hou Shi-min (侯士敏)a, Zhang Geng-min (张耿民)a, Liu Wei-min (刘惟敏)a, Xue Zeng-quan (薛增泉)a, Wu Jin-lei (吴锦雷)a, Wang Shu-feng (王树峰)b, Liang Rui-sheng (梁瑞生)b, Huang Wen-tao (黄文涛)b, Wang Dan-ling (王丹翎)b, Gong Qi-huang (龚旗煌)b   

  1. a Department of Electronics, Peking University, Beijing 100871, China; b Department of Physics, Peking University, Beijing 100871, China
  • Received:2001-03-14 Online:2001-12-25 Published:2005-07-07
  • Supported by:
    Project supported partly by the National Natural Science Foundation of China (Grant No. 60071017) and the Natural Science Foundation of Beijing, China (Grant No. 2992019).

摘要: The third-order optical nonlinearity of Ag-O-Cs thin films, where Ag nanoparticles are embedded into a CsxO semiconductor matrix, was measured by the femtosecond optical Kerr technique. The third-order nonlinear optical susceptibility, $\chi$(3), of the thin films was estimated to be 1.1×10-9 esu at the incident wavelength of 820 nm. The response time, i.e. the full width at half-maximum of the Kerr signal, is as fast as 114 fs only. The intrinsic third-order optical nonlinearity can be attributed to the intraband transition of electrons from the occupied state near the Fermi level to the unoccupied state. It is suggested that such a nonlinearity is further enhanced by the local field effect that is present in the metallic nanoparticles composite thin films.

Abstract: The third-order optical nonlinearity of Ag-O-Cs thin films, where Ag nanoparticles are embedded into a CsxO semiconductor matrix, was measured by the femtosecond optical Kerr technique. The third-order nonlinear optical susceptibility, $\chi$(3), of the thin films was estimated to be 1.1×10-9 esu at the incident wavelength of 820 nm. The response time, i.e. the full width at half-maximum of the Kerr signal, is as fast as 114 fs only. The intrinsic third-order optical nonlinearity can be attributed to the intraband transition of electrons from the occupied state near the Fermi level to the unoccupied state. It is suggested that such a nonlinearity is further enhanced by the local field effect that is present in the metallic nanoparticles composite thin films.

Key words: optical Kerr effect, metallic nanoparticles, third-order nonlinearity

中图分类号: 

  • 4265