Image charge effect on the light emission of rutile TiO<sub>2</sub>(110) induced by a scanning tunneling microscope<xref rid="cpb_27_7_077301_fn1" ref-type="fn">*</xref><fn id="cpb_27_7_077301_fn1"> <label>*</label><p>Project supported by the National Key R&D Program of China (Grant Nos. 2016YFA0300901 and 2017YFA0205003), the National Natural Science Foundation of China (Grant Nos. 11634001 and 21725302), and the Key Research Program of the Chinese Academy of Sciences (Grant No. XDPB08-1).</p></fn>

Image charge effect on the light emission of rutile TiO₂(110) induced by a scanning tunneling microscope* *

Project supported by the National Key R&D Program of China (Grant Nos. 2016YFA0300901 and 2017YFA0205003), the National Natural Science Foundation of China (Grant Nos. 11634001 and 21725302), and the Key Research Program of the Chinese Academy of Sciences (Grant No. XDPB08-1).

Guo Chaoyu¹, Meng Xiangzhi¹, Wang Qin¹, Jiang Ying^{1, 2, 3, †}

(color online) (a) Schematic of plasmon-enhanced light emission in the STM junction. (b) Energy diagram illustrating the mechanism for light emission of Au(111) sample. Elastic (ET) and inelastic tunneling (IET) processes are indicated by solid and dashed arrows, respectively. (c) Light emission spectra recorded on the bare Au(111) surface (constant-current mode, I = 2 nA, V = 1.5 V–3.5 V). The green arrows indicate the cut-off wavelengths (maximum photon energy, E_max) of the light emission spectra. (d) The maximum photon energy (E_max) as a function of bias voltage.