Modeling random telegraph signal noise in CMOS image sensor under low light based on binomial distribution
Zhang Yu1, 2, †, 
, Lu Xinmiao2, Wang Guangyi1, 2, Hu Yongcai2, Xu Jiangtao3
, Lu Xinmiao2, Wang Guangyi1, 2, Hu Yongcai2, Xu Jiangtao3 RTS noise histograms of the devices with different channel lengths when the density of the oxide trap is set to 4 × 1017 cm−3·eV−1.
