Charge recombination mechanism to explain the negative capacitance in dye-sensitized solar cells
Feng Lie-Feng†, , Zhao Kun, Dai Hai-Tao, Wang Shu-Guo, Sun Xiao-Wei
       

Calculation results from model of Fig. 1. Behaviors of recombination resistances (a) Rrac and (b) Rrdc caused by AC small signal perturbation and DC, respectively; dependences of (c) Rrac and (d) Crac on frequencies at different values of k (namely 1/τ). We do not consider the product of other factor because these product only change the magnitude of Rrac and Crac without changing the relationship between them and the frequency.