Theoretical analysis of the influence of flexoelectric effect on the defect site in nematic inversion walls

Zheng Gui-Li^{1, 2, 3, †,}, Zhang Hui³, Ye Wen-Jiang³, Zhang Zhi-Dong^{3, ‡,}, Song Hong-Wei⁴, Xuan Li¹

Deviation of azimuthal angle β versus external applied voltage U inside the +1 defect with ρ = 3 μm, ρ = 6 μm, ρ = 9 μm, ρ = 12 μm, and ρ = 15 μm.