Bandgap narrowing in the layered oxysulfide semiconductor Ba3Fe2O5Cu2S2: Role of FeO2 layer
Zhang Han1, Jin Shifeng1, †, , Guo Liwei1, Shen Shijie1, Lin Zhiping1, Chen Xiaolong1, 2
       

PXRD pattern collected from the Ba3Fe2O5Cu2S2 sample and the Rietveld refinement profiles.