X-ray emission from 424-MeV/u C ions impacting on selected target

Zhou Xian-Ming^{1, 2, 3}, Cheng Rui¹, Lei Yu¹, Sun Yuan-Bo^{1, 3}, Wang Yu-Yu¹, Wang Xing^{1, 5}, Xu Ge^{1, 3}, Mei Ce-Xiang⁴, Zhang Xiao-An⁴, Chen Xi-Meng², Xiao Guo-Qing¹, Zhao Yong-Tao^{1, 5, †,}

Experimental K-shell x-ray production cross sections of Ti, V, Fe, Co, Ni, Cu, and Zn for 430 MeV/u C⁶⁺ ion impact and theoretical calculations with considering the multiple ionization. The solid line represents the BEA prediction corrected by multiple-ionization fluorescence (BEA+MI). Dashed line refers to the ECPSSR simulation with using the multiple-ionization fluorescence (ECPSSR + MI).