Extended x-ray absorption fine structure study of MnFeP<sub>0.56</sub>Si<sub>0.44</sub> compound

Extended x-ray absorption fine structure study of MnFeP_0.56Si_0.44 compound

Li Ying-Jie^a), Haschaolu W^a), Wurentuya ^a), Song Zhi-Qiang^a), Ou Zhi-Qiang^a), Tegus O†^b), Nakai Ikuo^b)

X-ray powder diffraction patterns of MnFeP_0.56Si_0.44 taken at 295 K. The typical indices of the reflections are labeled.