Energy distribution extraction of negative charges responsible for positive bias temperature instability*
Ren Shang-Qing†, Yang Hong, Wang Wen-Wu‡, Tang Bo, Tang Zhao-Yun, Wang Xiao-Lei, Xu Hao, Luo Wei-Chun, Zhao Chao, Yan Jiang, Chen Da-Peng, Ye Tian-Chun
       
Structure of NMOSFET tested in this work.